[Review of the book The Stanford Revision and Extension of the Binet-Simon Scale for Measuring Intelligence
Journal of Applied Psychology · Volume 2 · Issue 3
Abstract
Reviews the monograph, The Stanford Revision and Extension of the Binet-Simon Scale for Measuring Intelligence by Lewis M. Terman et al (1917). This monograph summarizes the data on which is based Terman's revision and extension of the Binet Scale as published in his Measurement of Intelligence . No psychologist, whether favorably or unfavorably disposed towards the methods of mentality testing, should fail to read this monograph, as it is by far the most important recent contribution to the problems of measuring intelligence. The topics treated are also of vital importance to teachers and educational administrators, and a widespread familiarity with this monograph should prevent many misuses of mental tests by persons not sufficiently acquainted with their true nature and significance. (PsycInfo Database Record (c) 2025 APA, all rights reserved)
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