[Review of the book Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests

Abstract

Reviews the book, Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests by Lewis M. Terman (1920). This "Guide" is based on Terman's Measurement of Intelligence and "a similar guide [that] had been prepared in the Office of the Surgeon-General for use in the army." Neither this Guide nor the "Abbreviated Filing Record Card" should be used by the novice in mental testing. (PsycInfo Database Record (c) 2025 APA, all rights reserved)